Addressing the effect of stacking faults in X-ray diffractograms of graphite through atom-scale simulations
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Origin | Publisher files allowed on an open archive |
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licence |
Marc Monthioux : Connect in order to contact the contributor
https://hal.science/hal-04553433
Submitted on : Saturday, April 20, 2024-2:08:17 PM
Last modification on : Tuesday, April 23, 2024-3:25:16 AM